What's New at Photon Inc.
Announcements and Special Offers
New Products
Recent Publications
Press Releases
Newsletters
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Announcements and Special Offers:
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New Products:
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 FireWire BeamPro - 12-bit Beam Profiler with FireWire
(IEEE 1394) Connectivity and High Dynamic Range.
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NanoScan Near Field Profiler - Measuring the near field of sources such as
laser diodes, VCSELs, optical fiber, and/or
waveguides.
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USBeamPro - 10-bit CMOS camera with USB 2.0 computer interface--small and easy-to-use with Photon's BeamPro software
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Platen Profiler - Photon's Platen Profiler is a real-time printhead diagnostic instrument designed for manufacturing, aligning, and testing Laser Scan Units (LSU) and laser printers.
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Publications (PDF and Powerpoint File Formats):
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Instantaneous measurement of M2 beam propagation ratio in real-time (PDF file - 1.36Mb) - A new instrument design allows the M2 beam propagation ratio to be measured in real-time at the update rate of a standard CCD camera. - Copyright 2008 Society of Photo-Optical Instrumentation Engineers. This paper was published in SPIE Proceedings: Solid State Lasers XVII: Technology and Devices Paper Number: 6871-2 and is made available as an electronic reprint with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. By Allen M. Cary, Jeffrey L. Guttman, Razvan Chirita, Derrick W. Peterman, Photon Inc, San Jose, CA., USA
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The Misunderstood M2 (PDF file - 54Kb) - Understanding the measurement and following proper procedure will yield accurate results. - Reprinted from the August 2005 edition of SPIE's oemagazine. By Derrick Peterman, Photon, Inc., San Jose, CA., USA
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Diagnostic Technique for Real-Time Measurement of Optical and Scan Properties of
Optical Printheads (PDF file - 441Kb) - Presented at the Society for Imaging Science and Technology (IS&T) NIP21 International Conference on Digital Printing Technologies Baltimore, MD September 18-23, 2005. Jeffrey L. Guttman, Razvan Chirita, and Terri Au, Photon, Inc., San Jose, CA., USA
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Scanning Slit Profiler for Characterizing Optical Assemblies (PDF file - 1.4Mb) - Scanning slits and single element detectors accommodate a wide variety of wavelengths, beam powers, and beam sizes. By Derrick Peterman, Ph.D. Reprinted from the Nasa Tech Briefs, Photonics Tech Briefs, Vol. 27, No. 11, November 2003.
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Press Releases:
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August 13, 2007
Photon Inc. Announces Distribution Agreement for Switzerland and Italy with BFi Optilas
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June 27, 2007
Photon Inc.'s NanoScan Beam Profiler Operates on Microsoft Windows® Vista
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May 1, 2007
Photon Measures M2 of a Laser over 1 Million Times
with New Real-Time M2 Measurement System
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March 27, 2007
Photon Inc. and Telepro Inc. Announce Canadian Distribution Agreement.
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March 22, 2007
Photon Inc. Announces Software to Support Beam Profiling from Multiple Cameras
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October 12, 2006
Photon Inc. and TeraComm, LLC Announce Representation Agreement
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August 14, 2006
Photon Announces a 12-bit Beam Profiler with FireWire (IEEE 1394) Connectivity and High Dynamic Range
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July 27, 2006
Photon Achieves NIST Traceability for its Entire Beam Profiling Product Line
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June 22, 2006
Photon Announces New Measurement Capabilities for Next Generation Fiber Optic Communications
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May 15, 2006
Photon Announces New Automated Beam Profiling Rail System
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October 31, 2005
Photon Announces Beam Profiler with USB 2.0 Connectivity and High Dynamic Range
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October 25, 2005
Photon Announces New Automated Technique of M2 Measurement
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October 20, 2005
Photon Announces that it is on track for full RoHS and WEEE Compliance
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July 18, 2005
Photon Announces New 2-D and 3-D Visualization Added to NanoScan Beam Profiler
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March 28, 2005
Photon Announces New Laser Diode Bar Profiling Capabilities
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March 28, 2005
Photon Announces ActiveX Server Interface for
NanoScan
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February 10, 2005
Photon Announces a New Instrument for Profiling LEDs.
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November 9, 2004
Photon Granted Patent for High Dynamic Range Profiling Tool for
Optical Fibers, Laser Diodes, and LED's.
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September 30, 2004
High Power NanoScan: Photon Announces a New Tool to Profile High Power
Industrial Lasers.
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January 12, 2004
NanoModeScan: Photon Announces New Tool for M-squared
Measurements.
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Newsletters:
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Photon Newsletter - Vol. 3 No. 1 (PDF file - 876Kb).
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Photon Newsletter - Vol. 2 No. 1 (PDF file - 466Kb).
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Photon Newsletter - Vol. 1 No. 1 (PDF file - 1.7Mb).
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