Photon Inc. - Papers & Publications

Photon Inc. Publications

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Instantaneous measurement of M² beam propagation ratio in real-time - (1.36Mb)
A new instrument design allows the M² beam propagation ratio to be measured in real-time at the update rate of a standard CCD camera.

Author(s): Allen M. Cary, Jeffrey L. Guttman, Razvan Chirita, Derrick W. Peterman, Photon Inc
- Copyright 2008 Society of Photo-Optical Instrumentation Engineers. This paper was published in SPIE Proceedings: Solid State Lasers XVII: Technology and Devices Paper Number: 6871-2 and is made available as an electronic reprint with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

Performance Test of Long Trace Profiler Part 5.1: Noise due to Laser Pointing Instability - (566kb)
This Note continues a Series of works aimed (i) to investigate the performance of the existing LTP instrument as well as (ii) to determine its potential capabilities, and (iii) to lay out the measures and means for improvement of surface slope measurement with the LTP.

Author(s): S. C. Irick, W. R. McKinney, D. Peterman, V. V. Yashchuk - Used by permission.

The Misunderstood M² - (54kb)
Understanding the measurement and following proper procedure will yield accurate results. By Derrick Peterman, Ph.D., Photon, Inc., San Jose, CA., USA
- Reprinted from the August 2005 edition of SPIE's oemagazine

Fiber Lasers Pose Special Challenges for Beam Profiling - (410 Kb)
Derrick Peterman, Photon, Inc., San Jose, CA., USA
- Reprinted with revisions to format,from the October 2005 edition of LASER FOCUS WORLD
Copyright 2005 by PennWell Corporation

Diagnostic Technique for Real-Time Measurement of Optical and Scan Properties of Optical Printheads - (441 Kb)
Jeffrey L. Guttman, Razvan Chirita, and Terri Au, Photon, Inc., San Jose, CA., USA
- Presented at the Society for Imaging Science and Technology (IS&T) NIP21 International Conference on Digital Printing Technologies Baltimore, MD
September 18-23, 2005

Scanning Slit Profiler for Characterizing Optical Assemblies - (1.4 Mb)
Scanning slits and single element detectors accommodate a wide variety of wavelengths, beam powers, and beam sizes. By Derrick Peterman, Ph.D.
- Reprinted from the Nasa Tech Briefs, Photonics Tech Briefs, Vol. 27, No. 11.
November 2003

Two-dimensional microlens arrays in silica-on-silicon planar lightwave circuit technology - (675 Kb)
By Alexei L. Glebov et al., Fujitsu Laboratories of America, 3811 Zanker Road, San Jose, California 95134.
- Used by permission of Fujitsu and Alexei L. Glebov. © 2003 Society of Photo-Optical Instrumentation Engineers
May 16, 2003

Mode-Field Diameter and "Spot Size" Measurements of Lensed and Tapered Specialty Fibers - (830 Kb)
by Jeffrey L. Guttman
- Presented at the National Institute of Standards and Technology Symposium on Optical Fiber Measurements
September 24-26, 2002

A New Paradigm for Free-Space Optical Alignment of Telecom Devices - (105 Kb)
Allen M. Cary, Jeffrey L. Guttman, John Fleischer
- Presented at the Pho Pack 2002 Conference at Stanford, CA, July 16, 2002

Beam Profiling - White Paper(1.6 Mb)
This white paper describes beam profiling and how it works, why it's important, how it's applied in the real world, and the beam profiling methodologies developed and utilized by Photon Inc.

Manufacturing Low Insertion Loss Fiber-Lens Elements (1.0 Mb)
Derrick Peterman, Ph.D., John Fleischer and Dan C. Swain. A similar version of this paper appeared in the February 2002 issue of "Photonics Spectra", published by Laurin Publishing Co.

Fiber-lens alignment is a required production step for numerous fiber optic components, and the goal is to minimize the insertion loss as the light passes through the fiber-lens pair. Profiling the light emitted from the lens-fiber pair is important for developing processes that can be automated and have a high degree of repeatability. This paper describes how Photon can provide solutions for these processes.

Real-Time Scanning Goniometric Radiometer for Rapid Characterization of Laser Diodes and VCSELs (0.9 Mb)
Jeffrey L. Guttman, John M. Fleischer, and Allen M. Cary

- Presented at Laser Beam Optics Characterization (LBOC) VI; Munich, Germany; June 2001

A Novel Far-Field Scanning Technique for Rapid Measurement of Optical Fiber Parameters (0.9 Mb)
Jeffrey L. Guttman, Razvan Chirita, and Carmen D. Palsan
- Presented at the NIST Symposium on Optical Fiber Measurement; Boulder, CO; September 2000

Optical Fiber Analysis Using Moving Slits, CCD Arrays, And Goniometer Techniques (1.2 Mb)
Hale R. Farley, Jeffrey L. Guttman, Carmen D. Palsan and Razvan Chirita
- Presented at NFOEC 2000; Denver, CO; August 2000

Mode Field Diameter And Effective Area Measurement Of Dispersion Compensation Optical Devices (1.1 Mb)
Hale R. Farley, Jeffrey L. Guttman, Razvan Chirita and Carmen D. Palsan
- Presented at NFOEC 2000; Denver, CO; August 2000

Laser Doppler Velocimetry Uncertainty Analysis For Rotor Blade Tip Vortex Measurements (1.2 Mb)
Preston B. Martin, Gregory J. Pugliese and J. Gordon Leishman
- Used by permission of Department of Aerospace Engineering, University of Maryland. http://www.enae.umd.edu

Presentations

LED Profiler - (0.7 Mb)
High Power and M² - (0.6 Mb)
Characterization of the Near-Field Profile of Semiconductor Lasers and the Spot Size of Tightly Focused Laser Beams from Far-Field Measurements - (3.6 Mb)
- Presented at the 7th International Workshop on Laser Beam and Optics Characterization
September 18-19, 2002 by Jeffrey L. Guttman, Ph.D.
Mode-Field Diameter and "Spot Size" Measurements of Lensed and Tapered Specialty Fibers - (1.3 Mb)
- Presented at the National Institute of Standards and Technology Symposium on Optical Fiber Measurements
September 24-26, 2002 by Jeffrey L. Guttman, Ph.D.
A New Paradigm for Free-Space Optical Alignment of Telecom Devices - (0.9 Mb)
Allen M. Cary, Jeffrey L. Guttman, John Fleischer
The Scanning Goniometric Radiometer (3.9 Mb)
A Revolutionary Technique for Characterizing Divergent Light Sources: Laser Diodes, VCSEL's, Optical Fibers, Waveguides, LED's,...
- Presented by Jeffrey Guttman, Ph.D. at the April 23, 2002 meeting of the Santa Clara Valley (Silica Valley, California) IEEE Lasers & Electro-Optics Society (LEOS)
ABSTRACT: Measurements of the irradiance pattern of light sources has traditionally been performed using instrumentation systems commonly referred to as "goniometers" or "goniophotometers". These systems comprise a detector and a fixture for holding the source, and the measurement is made either by moving the detector about the source at a fixed radius or by rotating the source on a rotation stage with the detector stationary. With these systems, the time required to measure the far field pattern along a single azimuth ranges typically from a few minutes up to an hour. These time constraints made it difficult if not practically impossible to perform more complete characterization of the irradiance pattern of optical sources. An improvement to these methods, the "scanning goniometric radiometer", offers up to 3 or more orders of magnitude increase in measurement speed, up to 2 orders of magnitude improvement in angular sampling resolution, and a measurement field-of-view up to 360°. Details of the new technique, and application examples for measurements fo laser diodes, VCSEL's, LED's and optical fiber will be presented.