Photon's quick and easy RFQ wizard to get pricing on the best profiler for your application.
Laser Beam Profiler Product Overview
Solution for virtually every application requiring laser beam diagnostics
Photon offers a range of laser beam profilers that cover a wide range of profiling applications. Used alone or with lenses and/or optional fixtures, almost every laser beam analysis application can benefit from laser beam profiling.
The product table above will take you directly to a specific product of interest, while the Details section below will give you a short description of each product family.
Scanning Slit Profilers
High Power NanoScan
NanoScan
NanoScan and High-Power NanoScan provide nanometer accuracy and precision for beam pointing and width measurements, allowing rapid, precise optical alignment and component assembly with orders of magnitude greater precision than the legacy BeamScan. Using two slits to obtain orthogonal beam widths with one mechanical motion, it provides real-time measurements up to every 50ms (20Hz update rate).
Camera-Based Profilers
High Energy Focused Spot BeamProfiler
USBeamPro CCD
USBeamPro
FireWire BeamPro
Photon has recently added two new camera-based profiler solutions. Joining the FireWire BeamPro and the USBeamPro are the USBeamPro CCD and the High-Energy Focused Spot Beam Profiler. All camera profilers provide highly accurate measurements on both pulsed and CW lasers with wavelengths from 190nm to 1100nm over a wide range of beam widths and power/energy levels.
M2 Measurements
NanoModeScan
The NanoModeScan makes M2 measurements of almost any laser within as little as 20 seconds.
ModeScan 1780
The ModeScan Model 1780 makes real-time instantaneous M2 measurements for lasers with wavelengths from 190nm to 1100nm.
Near-Field Profilers
Camera-Based NFP shown w/ FireWire BeamPro and ATP-K
Scanning-Slit NFP w/ NanoScan
Near-field profiling is a common technique used to analyze small laser beams and other sources such as laser diodes, VCSELs, optical fiber, and/or waveguides. The technique involves a microscope objective lens to image the beam onto a detector. Photon has several near-field profiling instruments, based on both the NanoScan and BeamPro profilers to fit a variety of applications.
Far-Field Profilers
LD 8900 HDR
LD 8900/R
Far-Field Profilers use goniometric radiometer technology to provide real-time measurements of divergent light sources. Based on a patented scanning method in which neither the source nor the detector moves, user obtains full 3D hemispheric irradiance measurements with high spatial resolution. The Goniometer makes XY measurements in a few seconds; full 3D measurements from 20 seconds to 2 minutes depending on the phi angle resolution required.
The LED Profiler is a far-field profiler that generates high dynamic range light intensity profiles of LEDs. The system characterizes the LED profile over a 260 degree wide range-of-view, and generates a complete, 3D profile of the test source. A thermo-electric cooled vacuum chuck option is also available to test bare-chip LEDs over a range of temperatures.
