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Scanning-Slit Near-Field Profilers
Makes measuring small beams easy
Measuring the near field of sources such as laser diodes, VCSELs, optical fiber, and/or waveguides can be a difficult task. Accurate measurement of such small sources to the micron level requires high precision in the optical and mechanical design. To simplify this task and to fill this requirement, Photon offers several models of Near-Field Profilers (NFPs) covering a wide range of wavelengths and power levels. Another important application of these instruments is to extend the focused laser spot size measurement range of the NanoScan profiler.
By expanding the size of a focused spot it is possible to reduce the power density and make possible the measurement of beams that are too powerful to be measured without attenuation, as well as those that are too small to be accurately measured with the standard scan head. The NanoScan NFPs are easy-to-use turnkey systems that can be used either as a stand-alone instrument or integrated into manufacturing inspection systems.
For NanoScan users who want to extend the measurement capability of their present systems, the optical and mechanical components are also available as accessories.
The NFP-980 with 60:1 magnification and 1µm resolution, specifically designed for measurement of 980nm pump lasers, is also ideal for other applications in the wavelength range between 700nm-1100nm. The NFP-1550, with 40:1 magnification and 2.6µm resolution, is designed for use in characterizing sources in the 1300nm-1600nm telecommunications wave-length band. Both models come with a NanoScan GE/9/5 scan head and the magnifying objective lens, which can be rigidly mounted to an optional precision XYZ translation stage, which in turn is mounted to an optical rail. They also include the NanoScan Control and Data Acquisition Card and NanoScan Acquisition and Analysis Software. The system has all the standard Windows file saving, printing, communication and ActiveX capability.
For visible wavelengths, the NFP-VIS is equipped with the NanoScan SI/9/5 scan head and the 60:1 microscope objective, AR coated for the 400-700nm wavelength range. UV Wavelengths below 380nm can also be accommodated with an optional UV corrected microscope objective.
For higher power and longer wavelength beams the NFP-Pyro is available. These systems can measure spot sizes from 5µm at any wavelength from 190nm to 20µm. The NFP-Pyro is for beam powers up to 100W. This instrument configuration naturally reduces the power density incident on the instrument by one over the square of the magnification. The system comes with a lens for the user-specified wavelength of use.
For viewing VCSEL junctions, single-mode fibers and large long wavelength LD junctions there is an optional 100:1 objective lens option, producing diffraction limited performance from 400-700nm with a working distance of approximately 0.25-0.35mm and. Numerical Aperture is 0.90. From 700-1600nm, this lens produces near diffraction-limited performance.
| NanoScan Near-Field Profiler Specifications | |||
|---|---|---|---|
| Parameter | NFP-VIS | NFP-980 | NFP-1550 |
| Tester Wavelength Range: | 400 - 700nm <360nm optional | 700 - 1100nm | 1300 - 1700nm |
| Lens spread function: | 0.49µm | 1.1µm | 2.6µm |
| Maximum Source: | 140µm | 140µm | 200µm |
| Objective focal length: | 3mm | 3mm | 5.1mm |
| Objective Rear Focal Distance: | 160mm | 160mm | 207mm |
| Objective Numerical Aperture: | 0.85 | 0.85 | 0.48 |
| Objective Magnification: | 60:1 | 60:1 | 40:1 |
| NanoScan Model: | NSSI/9/5 | NSGE/9/5 | NSGE/9/5 |
| Aperture size: | 9mm | 9mm | 9mm |
| Slit width: | 5µm | 5µm | 5µm |
| 3 Axis Stage Travel | |||
| X (Across rail): | 13mm micrometer adjust | ||
| Y (normal to rail): | 6.5mm fine pitch actuator | ||
| Z (along rail): | 13mm micrometer adjust | ||
Specifications subject to change without notice
NanoScan integrated software operates on the latest Microsoft Windows Platforms and the system is available with either PCI or USB 2.0 hardware interfaces. The software reports laser beam parameters beam width, pointing, divergence and more for up to 32 beams. Beam width can be determined by 4-sigma, 1/e2, FWHM and any parameter can be charted using time statistics.
NanoScan M2 Wizard Software Screens
The M2 Wizard View is an interactive program for determining the "times diffraction limit" factor M2 by the Rayleigh Method. The M2 Wizard View prompts and guides the user through a series of measurements and data entries required for calculating M2. The entered and calculated values are displayed in each step of the Wizard.
When referring to Operating Space Charts using a NanoScan Near-Field Profiler, remember that the Operating Space Charts apply to the beam after magnification.
NanoScan Mechanical Dimensions
