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LD 8900HDR Far-Field Profiler

Highest dynamic range Goniometric Radiometer with fast, accurate measurements

LD 8900HDR Goniometric Radiometer

The photonics community needs a method for very high dynamic range measurements of optical fiber, waveguide and other optical components. Advances in DWDM technology, increased deployment of standard fibers, and the growing development of specialty fibers all require more accurate characterization. Until now, these high dynamic range measurements of irradiant light flux have been very difficult to obtain. Photon has the solution: our new goniometric radiometer, the LD 8900HDR Far-Field Profiler.

Details

The LD 8900HDR Far-Field Profiler uses goniometric methodology to measure true 3-dimensional profiles of optical components with up to 93 dB dynamic range. All measurements are taken with the emitting fiber, planar waveguide, laser diode or LED inserted directly into the center of the instrumentıs radial measurement area. For optical fiber, the far-field distribution pattern is acquired without bending the fiber. Bending the fiber can cause analysis and reporting inaccuracies.

LD 8900 Closeup 1 LD 8900 Closeup 2

These two close-ups of the LD 8900HDR show a single-mode optical fiber mounted in the fiber clip prior to measurement

The Model LD 8900HDR analysis software calculates these optical fiber parameters from the far-field profile, the method described in the TIA/EIA FOTP-191 standard for MFD requiring a minimum of 50 dB for proper measurement. The TIA/EIA FOTP-132 standard for Aeff requires a minimum of 50 dB for proper measurements as well. Parameters measured for optical fiber are:

This wider dynamic range provides greater signal-to-noise detail in the tails of the far-field pattern. Real-time data gathering and reporting of sample optical fibers or other sources is valuable for manufacturing and quality assurance evaluation.

Hardware and Computer

The LD 8900HDR is a modular system that allows either one-dimensional or three-dimensional measurements. The 3D module is easily exchanged with the 1D hardware, and the system can be purchased with the 1D hardware, the 3D hardware or both. There are specially designed fiber mounting clips available for both the 1D and 3D configurations with a specially modified fiber cleaver and clip that guarantees proper fiber alignment. In addition, custom mounting devices are available for high dynamic range measurements of waveguides, laser diodes and LEDs.

The controller comprises the PC microprocessor, data acquisition card, scan-control card and LD 8900HDR acquisition and analysis software. A reference calibration standard (NIST traceable), 1310-nm, 0-dBm LD Light Source is also available. This is the measured reference at the time of original manufacture that can be used for unit verification by the user at a later date. For high dynamic range measurements in the visible spectrum, a silicon detector can be substituted with a spectral range of 320-1100nm and even higher 103dB dynamic range. Maximum light source unit size for direct measurements is approximately 12.7mm by 12.7mm.

In the 3D configuration the LD 8900HDR includes the 3D Motion Control Module and is capable of full 3D measurements with up to 200 azimuthal planes through the source.

Specifications

LD 8900HDR System Specifications

LD 8900HDR Profiler System Specifications
Sensor/Detector
Scan Radius: 132.4 mm
Scan Range: ±90°
Scan Time: <20 seconds
Spatial Sampling Resolution: 0.055 degrees, 3241 points/scan
Source Power: 10's of µW to 10's of W
Spectral Range
InGaAs detector: 800 - 1700nm
Dynamic Range
InGaAs detector: >93dB; input power and distribution dependent; 0 dBm (1mW) minimum for >50dB dynamic range
Silicon detector: >103dB; input power and distribution dependent; 0 dBm (1mW) minimum for >50dB dynamic range
Accuracy
MFD: ±0.5% (for nominal 9mm diameter fiber)
NA: <±1%
Aeff: <±1%
Angular Widths: <±0.05%
Parameters Measured
Mode-Field Diameter (MFD)
Numerical Aperture (NA)
Effective Area (Aeff)
Numerical Apertures: FWHM, 5%, 13.5%, 2 user-specified clip levels
Angular Widths: FWHM, 5%, 13.5%, 2 user-specified clip levels
Angular Width Ratios: FWHM, 5%, 13.5%, 2 user-specified clip levels
Angular Position: Centroid, Peak
Intensity or Amplitude: Centroid, Peak, 2 user-specified locations
Relative Integrated Power: Relative Power in user-specified cone angles about an arbitrary axis
Software Views
Polar Profile View
Rectangular Profile View
3D Polar View
3D Rectangular View
2D Topographic View
Beam Parameter Statistics
Time Statistics Charts
Power Distribution with 3D Centroid
Notes window for appending user comments
Data Update Rates
Single scan updates (Normal Mode): ~ 5Hz
Perpendicular Scan update (Normal Mode): ~ 0.5Hz
MFD Mode: ~20 seconds per scan
3D Profile Acquisition Time (times are PC dependent):
10 azimuthal scans: ~7s
20 azimuthal scans: ~14s
50 azimuthal scans: ~35s
100 azimuthal scans: ~70s
200 azimuthal scans: ~140s
File Saving and Data Logging
Data Files
Setup Configurations
Raw Data
Summary Parameters
Screen Bitmaps
Log to Files
Computer/Electrical
Software Operating System: Windows 2000/XP Professional
Communications: Serial COM port; ActiveX Automation
AC Power Required: 110V ~ 60Hz standard, 220V ~ 50Hz optional (Installation Category: Class II)
PC recommended: 800 MHz Pentium II or better
Monitor recommended: LCD Flat Panel SVGA Display 1024x768
Scan Unit Weight: 13.6 kg; 30 lbs.
Mechanical Dimensions (in mm)
Scan Unit: 306 x 306 x 360 (with 'feet')
3D Rotation Stage:306 x 306 x 63 306 x 306 x 63
Motion Controller: 248 x 89 x 56
Environmental Conditions
Temperature: 5°C to 40°C
Altitude: Up to 2000m
Maximum relative humidity: 80% for temperature up to 31°C decreasing linearly to 50% relative humidity at 40°C
Main supply voltage fluctuations: Not to exceed ±10% of the nominal voltage; Transient overvoltage according to Installation Category II; Pollution Degree 1 or 2 in accordance with IEC 664.

Specifications subject to change without notice

Software
Pulse Width Modulation. NIST (National Institute of Standards and Technology) traceability is established through a chain of measurements originating with a NIST standard reference material, and every Photon instrument is calibrated to this standard reference material. More - see NIST-traceable