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LD 8900 and LD 8900R Far-Field Profilers

Characterize divergent light source with Goniometric Radiometer technology

LD 8900 and LD 8900R Goniometric Radiometers

Challenged by trying to profile divergent light sources? Photon's far-field profilers characterize the angular radiation intensity of light simply and accurately. Both the LD 8900 and LD 8900R (wide dynamic range goniometric radiometer) provide full 3-dimensional measurements of the far-field pattern in minutes or less, with far better resolution than a CCD camera.

“After finishing the evaluation of available far-field measurement systems we have decided to use the LD8900 for our future developments. That's because of its performance and its easy integration from the software and hardware aspect. We also appreciate the fast and competent support from Photon during the system optimisation.”

— Andreas Walser, ESP-Engineering, Switzerland

Details

These far-field profilers provide direct real-time far-field measurements with >24dB dynamic range, while the wide dynamic range LD 8900R has a dynamic range of >36dB, which provides greater detail in the "tails" of the far-field pattern. Both models have an angular sampling resolution of 0.055° and a field-of-view of ±72° (144°), and are ideal for characterizing the light flux from many sources, including VCSELs, laser diodes (LDs), optical fibers, optical waveguides, and more. With the LD 8900R, measurement of the mode field diameter of optical fiber is now possible in real time with greater than 5% accuracy.

The LD 8900 and the LD 8900R are available with either a silicon or InGaAs detector and have a standard entrance aperture of 2mm, with an optional 10mm entrance aperture for use with larger sources such as LEDs and LD bars. These far-field profilers are modular units designed for R&D, manufacturing, and custom applications, such as testing LDs at the wafer level, measuring optical fiber attributes.

Mode Field Diameter in Real Time with LD 8900R

The LD 8900R allows for real-time measurements of Mode Field Diameter (MFD) with an accuracy of ±5%* for a nominal 10µm single-mode fiber. Mode Field Diameter (MFD) of single-mode optical fiber is measured using the methodology described in the Telecommunication Industry Association/ Electronic Industries Association (TIA/EIA) Standard FOTP-191. Specifically, the MFD is calculated using the Petermann II integral, with data sampled at angular resolution of 0.055° and collected over an angular extent of ±72° (144° viewing angle).

Alignment to the "Gonio" instruments is straightforward and requires minimal manipulation of the sources. All measurements are made with both source and detector stationary. The system can easily be incorporated into automated test protocols and interfaced via ActiveX software communication.

Specifications
LD 8900/LD 8900R System Specifications
Sensor/Detector
Scan Radius: 84 mm
Pinhole Size: 1000micron (options available)
Entrance Aperture: 2mm standard (optional 1cm)
Field of View: ±72° (144 degrees)
Azimuthal Scans: 1, 2, 10, 20, 50, 100, or 200
Spatial Sampling Resolution: 0.055 degrees, 3241 points/scan
Source Power: 10's of µW to 10's of W
Source Output: CW or Pulsed (rep rates > 10 kHz)
Wavelength Measurement: Optional
Statistics Calculated: Value, Mean, Minimum, Maximum, Standard Deviation
Spectral Range
Silicon detector: 320 - 1100nm
InGaAs detector: 800 - 1700nm
Parameters Measured
Angular Widths: FWHM, 5%, 13.5%, 2 user-specified clip levels
Numerical Apertures: FWHM, 5%, 13.5%, 2 user-specified clip levels
Angular Width Ratios: FWHM, 5%, 13.5%, 2 user-specified clip levels
Angular Position: Centroid, Peak
Intensity or Amplitude: Centroid, Peak, 2 user-specified locations
Mode-Field Diameter: LD 8900R only
Relative Integrated Power: Relative Power in user-specified cone angles about an arbitrary axis
Software Views
Polar profile View, single or perpendicular scans
Rectangular profile View, single or perpendicular scans
3D Polar View
3D Rectangular View
3D Scan Replay
Centroid Cross Sections
2D Topographic View
Beam Parameter Statistics
Time Statistics Charts
Power Distribution with 3D Centroid
Notes window for appending user comments
Data Update Rates
Single scan updates: ~ 5Hz
Perpendicular Scan updates: ~ 0.5Hz
3D Profile Acquisition Time (times are PC dependent):
10 azimuthal scans: ~10s
20 azimuthal scans: ~20s
50 azimuthal scans: ~35s
100 azimuthal scans: ~60s
200 azimuthal scans: ~100s
File Saving and Data Logging
Program Data and Setup Configuration Files
Ascii file Profiles and Summary Parameters
Raw 3D Scan Data in binary format
Log to Files and COM Ports
Screen Captures: BMP, JPG, GIF, TIFF, PNG
Computer/Electrical
Software Operating System: Windows 2000 Professional; Windows XP
Communications: RS-232 Serial COM port required ActiveX Automation
AC Power Required: 110V ~ 60Hz standard, 220V ~ 50Hz optional (Installation Category: Class II)
Main supply voltage fluctuations: Not to exceed ±10% of the nominal voltage; Transient overvoltage according to Installation Category II; Pollution Degree 1 or 2 in accordance with IEC 664.
Mechanical Dimensions (in mm)
Scanning Unit: 318 X 228 X 241
Scanner: 203 X 165 X 165
Motion Controller: 51 X 89 X 248
Environmental Conditions
Temperature: 5°C to 40°C
Altitude: Up to 2000m
Maximum relative humidity: 80% for temperature up to 31°C decreasing linearly to 50% relative humidity at 40°C

Specifications subject to change without notice

System Requirements
  • CPU: 1 GHz Pentium 4, Celeron, or better
  • OS: Microsoft Windows 2000 Professional, XP Professional, or Windows Vista Business
  • PCI: 1 open slot
  • RAM: 512 MB
  • Video: Support OpenGL and a minimum resolution of 1024x768
Software
Mechanical Dimensions
  • Scan Unit Dimensions: 206x165x190mm
  • Scan Unit Weight: ~6kg
Additional Information
Pulse Width Modulation. NIST (National Institute of Standards and Technology) traceability is established through a chain of measurements originating with a NIST standard reference material, and every Photon instrument is calibrated to this standard reference material. More - see NIST-traceable See Attenuators and Optics. See Camera-Based Near Field Profilers. Attenuation-Induced Error due to Thermal Lensing in Beam Measurement. See NanoScan Scanning-Slit Profiler.