QuickFind:
Products: NanoScan
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NanoScan Brochure (PDF)
NanoScan High Precision Beam Profiler
High Power NanoScan Beam Profiler
NanoModeScan
Rayleigh Range Fixture
Products: Camera-Based Profilers
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Camera Brochure (PDF)
ModeScan 1780
FireWire BeamPro
USBeamPro
Platen Profiler (PDF)
Platen Profiler 2424S(PDF)
Products: Near-Field Profilers
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NanoScan Near Field Profiler
Camera-Based Near-Field Profilers
Products: Far-Field Profilers
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LED Profiler
LD 8900 - Far-Field Profiler
LD 8900R - >36 dB Dynamic Range
LD 8900HDR - >93 dB Dynamic Range
Products: Legacy Products
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Model 2320 - integrated variable attenuator
Model 2321 - no variable attenuator
UView- Model 2322 - for UV wavelengths
PH 7290 - ElectroPhysics - for near IR wavelengths
Dynamic Beam Profiler
FO 8350 - Encircled Flux Fiber Analyzer
BeamScan
Collimation/Divergence Systems
Rayleigh Range System (RAL-FXT)
BeamScan Power Meter Option
Multiple Beam Analysis Software
Technical Resources
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Troubleshooting Checklist
Application/Technical Notes
BeamScan FAQ
BeamProfiler FAQ
Far-Field Profiler FAQ
Papers and Presentations
Quality Management System (PDF)
Calibration and Maint. Info
Repair Service Policy
Scan Slit Explained
Scan Slit Method
Beam Collimation
Index of Refraction
A measure of the speed of light in a material.
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