QuickFind:
Products: NanoScan
------------------------------------
NanoScan Brochure (PDF)
NanoScan High Precision Beam Profiler
High Power NanoScan Beam Profiler
NanoModeScan
Rayleigh Range Fixture
Products: Camera-Based Profilers
------------------------------------
Camera Brochure (PDF)
ModeScan 1780
FireWire BeamPro
USBeamPro
Platen Profiler (PDF)
Platen Profiler 2424S(PDF)
Products: Near-Field Profilers
------------------------------------
NanoScan Near Field Profiler
Camera-Based Near-Field Profilers
Products: Far-Field Profilers
------------------------------------
LED Profiler
LD 8900 - Far-Field Profiler
LD 8900R - >36 dB Dynamic Range
LD 8900HDR - >93 dB Dynamic Range
Products: Legacy Products
------------------------------------
Model 2320 - integrated variable attenuator
Model 2321 - no variable attenuator
UView- Model 2322 - for UV wavelengths
PH 7290 - ElectroPhysics - for near IR wavelengths
Dynamic Beam Profiler
FO 8350 - Encircled Flux Fiber Analyzer
BeamScan
Collimation/Divergence Systems
Rayleigh Range System (RAL-FXT)
BeamScan Power Meter Option
Multiple Beam Analysis Software
Technical Resources
------------------------------------
Troubleshooting Checklist
Application/Technical Notes
BeamScan FAQ
BeamProfiler FAQ
Far-Field Profiler FAQ
Papers and Presentations
Quality Management System (PDF)
Calibration and Maint. Info
Repair Service Policy
Scan Slit Explained
Scan Slit Method
Beam Collimation
Bending Loss, Microbending Loss
Loss in fiber caused by stress on the fiber bent around a restrictive radius.
© Copyright 2008 - Photon Inc. - All Rights Reserved
HOME
- Return to Photon Main Menu
