News from Photon Inc.

Archives

Press Releases

• September 17, 2009 - Photon Announces New USBeamPro CCD-Based Laser Beam Profiler
• July 20, 2009 - Photon Beam Profilers Operate on Apple® Computers
• March 30, 2009 - Photon Inc. and TerraComm Expand Representation Agreement
• June 5, 2008 - Photon Inc. Awarded Patent for Beam Profiling Instrument Used in Laser Printing Manufacturing
• March 28, 2008 - Photon Awarded Patent for Real-Time Goniospectrophotometer
• March 3, 2008 - Photon Inc.'s USBeamPro™ Beam Profiler Operates on Microsoft Windows® Vista
• April 30, 2008 - Photon Announces USB Interface for the NanoScan
• January 7, 2008 - Photon Announces New Collimation Measurement Instrumentation in the Mid-Infrared
• October 29, 2007 - Photon Inc. Announces Distribution Agreement for India with Infrared Optics

Archives

Newsletters

• September 2009 Newsletter
• July 2009 Newsletter
• May 2009 Newsletter
• February 2009 Newsletter

Archives

Publications

• Performance Test of Long Trace Profiler Part 5.1: Noise due to Laser Pointing Instability This Note continues a Series of works aimed (i) to investigate the performance of the existing LTP instrument as well as (ii) to determine its potential capabilities, and (iii) to lay out the measures and means for improvement of surface slope measurement with the LTP. Author(s): S. C. Irick, W. R. McKinney, D. Peterman, V. V. Yashchuk — Used by permission.
• The Misunderstood M2 Understanding the measurement and following proper procedure will yield accurate results. By Derrick Peterman, Ph.D., Photon, Inc., San Jose, CA., USA — Reprinted from the August 2005 edition of SPIE's oemagazine
• Fiber Lasers Pose Special Challenges for Beam Profiling Derrick Peterman, Photon, Inc., San Jose, CA., USA — Reprinted with revisions to format,from the October 2005 edition of LASER FOCUS WORLD © Copyright 2005 by PennWell Corporation
• Diagnostic Technique for Real-Time Measurement of Optical and Scan Properties of Optical Printheads Jeffrey L. Guttman, Razvan Chirita, and Terri Au, Photon, Inc., San Jose, CA., USA — Presented at the Society for Imaging Science and Technology (IS&T) NIP21 International Conference on Digital Printing Technologies Baltimore, MD September 18-23, 2005
• Scanning Slit Profiler for Characterizing Optical Assemblies Scanning slits and single element detectors accommodate a wide variety of wavelengths, beam powers, and beam sizes. By Derrick Peterman, Ph.D. — Reprinted from the Nasa Tech Briefs, Photonics Tech Briefs, Vol. 27, No. 11. November 2003
• Two-dimensional microlens arrays in silica-on-silicon planar lightwave circuit technology By Alexei L. Glebov et al., Fujitsu Laboratories of America, 3811 Zanker Road, San Jose, California 95134. — Used by permission of Fujitsu and Alexei L. Glebov. © 2003 Society of Photo-Optical Instrumentation Engineers May 16, 2003
• Mode-Field Diameter and "Spot Size" Measurements of Lensed and Tapered Specialty Fibers by Jeffrey L. Guttman — Presented at the National Institute of Standards and Technology Symposium on Optical Fiber Measurements September 24-26, 2002
• A New Paradigm for Free-Space Optical Alignment of Telecom Devices Allen M. Cary, Jeffrey L. Guttman, John Fleischer — Presented at the Pho Pack 2002 Conference at Stanford, CA, July 16, 2002
• Beam Profiling White Paper This white paper describes beam profiling and how it works, why it's important, how it's applied in the real world, and the beam profiling methodologies developed and utilized by Photon Inc.
• Manufacturing Low Insertion Loss Fiber-Lens Elements Fiber-lens alignment is a required production step for numerous fiber optic components, and the goal is to minimize the insertion loss as the light passes through the fiber-lens pair. Profiling the light emitted from the lens-fiber pair is important for developing processes that can be automated and have a high degree of repeatability. This paper describes how Photon can provide solutions for these processes. Derrick Peterman, Ph.D., John Fleischer and Dan C. Swain. — A similar version of this paper appeared in the February 2002 issue of "Photonics Spectra", published by Laurin Publishing Co.
• Real-Time Scanning Goniometric Radiometer for Rapid Characterization of Laser Diodes and VCSELs Jeffrey L. Guttman, John M. Fleischer, and Allen M. Cary — Presented at Laser Beam Optics Characterization (LBOC) VI; Munich, Germany; June 2001
• A Novel Far-Field Scanning Technique for Rapid Measurement of Optical Fiber Parameters Jeffrey L. Guttman, Razvan Chirita, and Carmen D. Palsan — Presented at the NIST Symposium on Optical Fiber Measurement; Boulder, CO; September 2000
• Optical Fiber Analysis Using Moving Slits, CCD Arrays, And Goniometer Techniques Hale R. Farley, Jeffrey L. Guttman, Carmen D. Palsan and Razvan Chirita — Presented at NFOEC 2000; Denver, CO; August 2000
• Mode Field Diameter And Effective Area Measurement Of Dispersion Compensation Optical Devices Hale R. Farley, Jeffrey L. Guttman, Razvan Chirita and Carmen D. Palsan — Presented at NFOEC 2000; Denver, CO; August 2000
• Laser Doppler Velocimetry Uncertainty Analysis For Rotor Blade Tip Vortex Measurements Preston B. Martin, Gregory J. Pugliese and J. Gordon Leishman — Used by permission of Department of Aerospace Engineering, University of Maryland.

Presentations

• LED Profiler
• High Power and M2
• Characterization of the Near-Field Profile of Semiconductor Lasers and the Spot Size of Tightly Focused Laser Beams from Far-Field Measurements by Jeffrey L. Guttman, Ph.D. — Presented at the 7th International Workshop on Laser Beam and Optics Characterization September 18-19, 2002
• Mode-Field Diameter and "Spot Size" Measurements of Lensed and Tapered Specialty Fibers by Jeffrey L. Guttman, Ph.D. — Presented at the National Institute of Standards and Technology Symposium on Optical Fiber Measurements September 24-26, 2002
• A New Paradigm for Free-Space Optical Alignment of Telecom Devices Allen M. Cary, Jeffrey L. Guttman, John Fleischer
• The Scanning Goniometric Radiometer A Revolutionary Technique for Characterizing Divergent Light Sources: Laser Diodes, VCSEL's, Optical Fibers, Waveguides, LED's,... Measurements of the irradiance pattern of light sources has traditionally been performed using instrumentation systems commonly referred to as "goniometers" or "goniophotometers". These systems comprise a detector and a fixture for holding the source, and the measurement is made either by moving the detector about the source at a fixed radius or by rotating the source on a rotation stage with the detector stationary. With these systems, the time required to measure the far field pattern along a single azimuth ranges typically from a few minutes up to an hour. These time constraints made it difficult if not practically impossible to perform more complete characterization of the irradiance pattern of optical sources. An improvement to these methods, the "scanning goniometric radiometer", offers up to 3 or more orders of magnitude increase in measurement speed, up to 2 orders of magnitude improvement in angular sampling resolution, and a measurement field-of-view up to 360°. Details of the new technique, and application examples for measurements fo laser diodes, VCSEL's, LED's and optical fiber will be presented. by Jeffrey Guttman, Ph.D. — Presented at the April 23, 2002 meeting of the Santa Clara Valley (Silica Valley, California) IEEE Lasers & Electro-Optics Society (LEOS)